LI Tongbao, an expert in optics and metrology, was born in Wen County, Henan Province on October 17, 1942. In 1963, he graduated from Tongji University in applied physics. In the same year, he worked in the Optical ResearchSection of China Institute of Metrology in Beijing. From April to November 1980, he did radiometric research in the National Institute of Standards and Technology (NIST) of the United States, during which he won the Outstanding Visiting Researcher Award. From 1983 to May 1999, he served as a researcher, Dean, and Honorary Dean of the National Institute of Measurement and Testing Technology of China. He was elected academician of the Chinese Academy of Engineering in 1994. He has been a professor and doctoral supervisor of Tongji University since June 1999.
LI has been engaged in the research of optical radiation measurement technology and standards. The weak light standard testing device developed by him proposed a new method for measuring extremely low transmittance, making it possible to measure the low light level illuminance of l0-6Lx with 5% uncertainty, which met the urgent needs of national defense such as night vision low light level devices and radioactive fluorescent materials at that time. He established a 500K-1000K full irradiation standard, improved the temperature measurement structure and measurement procedure of the radiation chamber, and significantly improved the quality of the blackbody radiator, which provided a technical basis for the detection of infrared guidance and scientific research and production of infrared weapon systems in China. He won the National Science Congress Award in 1978. The "Photometric Benchmark and Luminous Flux Sub-standard" project won the First Prize of 1985 National Science and Technology Progress Award. He headed the research project "Absolute Measurement Of 400-900nm Spectral Radiation Using Silicon Photodiode Self-Calibration Technology" and won the First Prize of National Scientific And Technological Progress in 1989. At present, he is engaged in the research of optical radiation measurement and acousto-optic technology, including sonoluminescence and sonofusion, and the realization of nanometer grating length standard by laser converging atoms. He established the first laboratory in China for developing nano-meter standards by using the method of laser standing wave field converging atoms. At present, he has achieved standard samples of 1/2 wavelength (213nm) and 2-dimensional nano-length with quality equivalent to that of NIST. These provide strong technical support for the rapid development of China's nanotechnology industry.
His bio is available on the official website of CAE:
http://www.cae.cn/cae/html/main/colys/75665618.html
